Go-No-Go Test

The Go-No-Go test is a neurological exam that tests for frontal lobe pathology. This test is a component of the Frontal Assessment Battery (FAB)

Exam

The examiner instructs the patient to tap once in response to a single tap, and to withhold a response for two taps. This test can be made more difficult by changing the initial rule after several trials (for example, ‘‘tap once when I tap twice, and not at all when I tap once’’).

For Clinicians